The Electron Microscope (EMC) user meeting and workshop will be held on January 25th-26th at Duncan Hall, Rice University.
For this meeting, discussions and workshops on cutting edge research will be presented. The topics are: STEM tomography, atomic resolution STEM imaging of 2D materials, monochromated EELS, FIB tomography with slice and view, imaging non-conductive samples with SEM, and SEM high resolution imaging.
The registration deadline in on January 21st.
To find out more about the event visit emc.rice.edu.